Zhang receives Test of Time Award 2017


November 17, 2017

ECE/INI associate research professor Pei Zhang recently received the ACM SenSys Test of Time Award (ToTA) 2017 for his 2004 research paper, “Hardware design experiences in ZebraNet.” The paper, which Zhang co-authored, examines techniques for supplying power to wireless sensor networks as well as methods for managing both energy consumption and peripheral devices in those networks. Zhang was honored at the 15th Association for Computing Machinery (ACM) Conference on Embedded Networked Sensor Systems (SenSys 2017), held November 5-8 in Delft, The Netherlands. The ToTA is awarded to research papers that are at least a decade old and have had lasting academic, industrial, and/or societal impacts on networked embedded sensing science and engineering.

Related People:

Pei Zhang